Scanning Electron Microscopy And X-Ray Microanalysis Third Edition By Joseph Goldstein Hardcover

Highly detailed resource for professionals and students covering SEM and X-ray microanalysis techniques, with emphasis on practical applications and interpretations.

• Hardcover format for durability
• Published by Springer
• Third edition with updated revisions
• Includes practical illustrations and examples
• Co-authored by noted experts in the field
ISBN 0-306-47292-9
Noticeable corner wear and minor scuffs on the cover.

Condition: Pre-Owned Good